Scaling like behaviour of resistivity observed in LaNiO₃ thin films grown on SrTiO₃ substrate by pulsed laser deposition

الأصل · EN

We discuss the origin of the temperature dependence of resistivity observed in highly oriented LaNiO₃ thin films (of thickness d) grown on SrTiO₃ substrate by a pulsed laser deposition technique. All the experimental data are found to collapse into a single universal curve [T/Tsf(d)]³/² for the entire temperature interval (20K<T<300K) with Tsf(d) being the onset temperature for triggering a resonant scattering of conduction electrons by spin fluctuations in LaNiO₃/SrTiO₃ heterostructure.