Phase estimation with weak measurement using a white light source
Xu, Xiao-Ye · Kedem, Yaron · Sun, Kai · Vaidman, Lev · Li, Chuan-Feng · Guo, Guang-Can
Original · EN
We report results of a high precision phase estimation based on a weak measurements scheme using commercial light-emitting diode. The method is based on a measurement of the imaginary part of the weak value of a polarization operator. The imaginary part of the weak value appeared due to the measurement interaction itself. The sensitivity of our method is equivalent to resolving light pulses of order of attosecond and it is robust against chromatic dispersion.
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