Preparation of Cobalt Thin Films by Sputtering Systems and Its Magnetic Characterization
Erkovan, Mustafa
الأصل · EN
Different thicknesses of cobalt thin films were growth by magnetron sputtering deposition techniques. The films thicknesses were determinated with X ray Photoelectron Spectroscopy (XPS) and Quartz Crystal Monitoring (QCM). XPS is also used to determinate the films quality. The films magnetic properties were determinated by Ferromagnetic Resonance (FMR) technique.
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