Self-referenced prism deflection measurement schemes with microradian precision
Olson, Rebecca · Paul, Justin · Bergeson, Scott · Durfee, Dallin S.
Original · EN
We have demonstrated several inexpensive methods which can be used to measure the deflection angles of prisms with microradian precision. The methods are self-referenced, using various reversals to achieve absolute measurements without the need of a reference prism or any expensive precision components other than the prisms under test. These techniques are based on laser interferometry and have been used in our lab to characterize parallel-plate beamsplitters, penta prisms, right angle prisms, and corner cube reflectors using only components typically available in an optics lab.
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