Comparison of Resonant Inelastic X-Ray Scattering Spectra and Dielectric Loss Functions in Copper Oxides

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We report empirical comparisons of Cu K-edge indirect resonant inelastic x-ray scattering (RIXS) spectra, taken at the Brillouin zone center, with optical dielectric loss functions measured in a number of copper oxides. The RIXS data are obtained for Bi₂CuO₄, CuGeO₃, Sr₂Cu₃O₄Cl₂, La₂CuO₄, and Sr₂CuO₂Cl₂, and analyzed by considering both incident and scattered photon resonances. An incident-energy-independent response function is then extracted. The dielectric loss functions, measured with spectroscopic ellipsometry, agree well with this RIXS response, especially in Bi₂CuO₄ and CuGeO₃.