Proximity effects and Andreev reflection in mesoscopic SNS junction with perfect NS interfaces
Kvon, Z. D. · Baturina, T. I. · Donaton, R. A. · Baklanov, M. R. · Maex, K. · Olshanetsky, E. B. · Plotnikov, A. E. · Portal, J. C.
Original · EN
Low temperature transport measurements on superconducting film - normal metal wire - superconducting film (SNS) junctions fabricated on the basis of 6 nm thick superconducting polycrystalline PtSi films are reported. The structures with the normal metal wires of two different lengths L=1.5 μm and L=6μm and the same widths W=0.3μm are studied. Zero bias resistance dip related to pair current proximity effect is observed for all junctions whereas the subharmonic energy gap structure originating from phase coherent multiple Andreev reflections have occurs only in the SNS junctions with short wires.
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