Magnetic resonance spectroscopy of single centers in silicon quantum wells
Bagraev, Nikolay T. · Klyachkin, Leonid E. · Kudryavtsev, Andrey A. · Malyarenko, Anna M.
Original · EN
We present the new optically-detected magnetic resonance (ODMR) technique which reveals single point defects in silicon quantum wells embedded in microcavities within frameworks of the excitonic normal-mode coupling (NMC) without the external cavity and the hf source.
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