Identification of vacancy defects in a thin film perovskite oxide
Keeble, D. J. · Mackie, R. A. · Egger, W. · Lowe, B. · Pikart, P. · Hugenschmidt, C. · Jackson, T. J.
Original · EN
Vacancy defects in thin film laser ablated SrTiO3 on SrTiO3 were identified using variable energy positron annihilation lifetime measurements. Strontium vacancy related defects were the dominant positron traps and, apart from in the top 50 nm, were found to be uniformly distributed. The surface layer showed an increase in annihilation from larger open-volume defects, large vacancy clusters or nanovoids.
English translation
This paper has no Arabic translation yet. Be the first: it takes a few seconds, and the result is stored for every future reader.