Observation of Four-Photon de Broglie Wavelength by State Projection Measurement
Sun, F. W. · Liu, B. H. · Huang, Y. F. · Ou, Z. Y. · Guo, G. C.
Original · EN
A measurement process is constructed to project an arbitrary two-mode N-photon state to a maximally entangled N-photon state (the NOON-state). The result of this projection measurement shows a typical interference fringe with an N-photon de Broglie wavelength. For an experimental demonstration, this measurement process is applied to a four-photon superposition state from two perpendicularly oriented type-I parametric down-conversion processes. Generalization to arbitrary N-photon states projection measurement can be easily made and may have wide applications in quantum information. As an example, we formulate it for precision phase measurement.
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