Electron Correlation Effects in Resonant Inelastic X-ray Scattering of NaV2O5
Zhang, G. P. · Callcott, T. A. · Woods, G. T. · Lin, L. · Sales, Brian · Mandrus, D. · He, J.
الأصل · EN
Element- and site-specific resonant inelastic x-ray scattering spectroscopy (RIXS) is employed to investigate electron correlation effects in NaV₂O₅. In contrast to single photon techniques, RIXS at the vanadium L₃ edge is able to probe d-d* transitions between V d-bands. A sharp energy loss feature is observed at -1.56 eV, which is well reproduced by a model calculation including correlation effects. The calculation identifies the loss feature as excitation between the lower and upper Hubbard bands and permits an accurate determination of the Hubbard interaction term U= 3.0 ± 0.2 eV.
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