Size effects of pyroelectric coefficient and dielectric susceptibility in ferroelectric thin films

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We calculate the pyrocoefficient, static dielectric susceptibility profiles and its thickness dependence of ferroelectric thin films. Also, the temperature dependences of above quantities have been calculated. For the calculations we use Landau phenomenological theory, leading to Lame equations. These equations subject to boundary conditions with different extrapolation length on the surfaces have been solved numerically. The divergency of pyroelectric coefficient and static dielectric susceptibility in the vicinity of thickness induced ferroelectric phase transition (i.e. at l≈ lc or % T≈ Tcl) has been shown to be the most prominent size effect in ferroelectric thin films.