Resonant Inelastic X-Ray Scattering (RIXS) in SrCuO₂
Higashiya, Atsushi · Shigemoto, Akihiko · Kasai, Shuuichi · Imada, Shin · Suga, Shigemasa · Sing, Michael · Kim, Changyoung · Yabashi, Makina · Tamasaku, Kenji · Ishikawa, Tetsuya
Original · EN
The resonant inelastic x-ray scattering (RIXS) was measured in an insulating SrCuO₂ with changing the incident photon energy (hν) near the Cu 1s absorption edge (K-edge). Complex structures and their dependences on the momentum transfer(Δk) and hν were observed. The hν dependence of the RIXS spectra measured for a constant Δk=2.4π has shown a remarkable enhancement near the absorption maximum and a shift of the spectral weight toward larger loss-energy with increasing hν. Also, the energy of the inelastic loss peak in the RIXS spectra for the fixed excitation at 8.993 keV, 10 eV below the absorption maximum, has shown a clear dependence on Δk. These results are in a qualitative agreement with a theoretical prediction. Full utilization of the potential of the high brilliance X ray light source at BL19LXU of SPring-8 with 27 m long insertion device will open up a breakthrough in RIXS for heavy transition metal compounds in accordance with the improvement in focussing and analyzing elements.
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