Frequency-dependent shot noise in long disordered SNS contacts
Nagaev, K. E.
Original · EN
The shot noise in long diffusive SNS contacts is calculated using the semiclassical approach. At low frequencies and for purely elastic scattering, the voltage dependence of the noise is of the form Sᵢ = (4Δ+ 2eV)/3R. The electron-electron scattering suppresses the noise at small voltages resulting in vanishing noise yet infinite dSᵢ/dV at V = 0. The distribution function of electrons consists of a series of steps, and the frequency dependence of noise exhibits peculiarities at ω= neV, ω= neV - 2Δ, and ω= 2Δ- neV for integer n.
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