Masaq Index
arXiv 2001-01-17 0 views

Fabrication and Characterization of Boron Carbide / n-Silicon Carbide Heterojunction Diodes

Adenwalla, S. · Welsch, P. · Harken, A. · Brand, J. I. · Sezer, A. · Robertson, B. W.

Original · EN

The fabrication, initial structural characterization and diode measurements are reported for the first boron carbide / silicon carbide heterojunction diode. Current-voltage curves obtained for operation at temperatures from 24 C to 388 C. PECVD-deposited undoped boron carbide material is highly crystalline and consists of a variety of polytypes of B-C with crystal sizes as large as 110 nm. Crystal phases are similar to those for PECVD B-C on Si but only partially match known boron and boron-rich B-C phases.

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