Depth-dependent critical behavior in V2H
Del Genio, Charo I. · Trenkler, Johann · Bassler, Kevin E. · Wochner, Peter · Haeffner, Dean R. · Reiter, George F. · Bai, Jianming · Moss, Simon C.
الأصل · EN
Using X-ray diffuse scattering, we investigate the critical behavior of an order-disorder phase transition in a defective "skin-layer" of V2H. In the skin-layer, there exist walls of dislocation lines oriented normal to the surface. The density of dislocation lines within a wall decreases continuously with depth. We find that, because of this inhomogeneous distribution of defects, the transition effectively occurs at a depth-dependent local critical temperature. A depth-dependent scaling law is proposed to describe the corresponding critical ordering behavior.
الترجمة العربية
لا توجد ترجمة عربية لهذا البحث بعد. كن أوّل من يطلبها: تستغرق ثوانيَ معدودة، وتُحفظ النتيجة لكل قارئ قادم.