Interface Motion in Disordered Ferromagnets
Roters, L. · Lubeck, S. · Usadel, K. D.
Original · EN
We consider numerically the depinning transition in the random-field Ising model. Our analysis reveals that the three and four dimensional model displays a simple scaling behavior whereas the five dimensional scaling behavior is affected by logarithmic corrections. This suggests that d=5 is the upper critical dimension of the depinning transition in the random-field Ising model. Furthermore, we investigate the so-called creep regime (small driving fields and temperatures) where the interface velocity is given by an Arrhenius law.
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