Precise Half-Life Measurement of the Superallowed Beta+ Emitter 26Si
Iacob, V. E. · Hardy, J. C. · Banu, A. · Chen, L. · Golovko, V. V. · Goodwin, J. · Horvat, V. · Nica, N. · Park, H. I. · Trache, L. · Tribble, R. E.
الأصل · EN
We have measured the half-life of the superallowed 0+ -to- 0+ beta+ emitter 26Si to be 2245.3(7) ms. We used pure sources of 26Si and employed a high-efficiency gas counter, which was sensitive to positrons from both this nuclide and its daughter 26mAl. The data were analyzed as a linked parent-daughter decay. To contribute meaningfully to any test of the unitarity of the Cabibbo-Kobayashi-Maskawa (CKM) matrix, the ft value of a superallowed transition must be determined to a precision of 0.1% or better. With a precision of 0.03% the present result is more than sufficient to be compatable with that requirement. Only the branching ratio now remains to be measured precisely before a +/-0.1% ft value can be obtained for the superallowed transition from 26Si.
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